Stated or inferred attribute non-attendance? A simulation approach Petr Mariel | David Hoyos | Jürgen Meyerhoff | Show more Petr Mariel Spain Universidad del País Vasco (UPV/EHU) Depto Economía Aplicada III (Econometría y Estadística) David Hoyos Spain Universidad del País Vasco (UPV/EHU) Depto Economía Aplicada III (Econometría y Estadística) Jürgen Meyerhoff Germany Technical University of Berlin Institute for Landscape Architecture and Environmental Planning.Technical University of Berlin. Submitted: 2016-03-04 | Accepted: | Published: 2013-06-07 DOI: https://doi.org/10.7201/earn.2013.01.03
